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CURRENT COLLAPSE MEASUREMENTS IN PULSED GAN TRANSISTORS
CURRENT COLLAPSE MEASUREMENTS IN PULSED GAN TRANSISTORS
2020
I.M. Abolduev
N. V. Alkeev
V. S. Belyaev
E.V. Kaevitser
I. D. Kashlakov
Keywords:
Materials science
Current (fluid)
collapse
Optoelectronics
Transistor
Correction
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