Composition dependent dielectric properties of KTaxNb1-xO3

Solid-state reaction method has been used for preparing pellet samples of mixed potassium tantalate niobate (KTaxNb1-xO3) (KTN) system for the compositions x = 0, 0.1, 0.2, 0.3, 0.4 and 0.5. X-ray diffraction (XRD) & energy dispersive x-ray analysis (EDAX) method have been used to characterize the prepared samples. Surface topography was studied by scanning electron micrographs (SEM). Dielectric constant, loss tangent, and electrical conductivity of prepared samples have been measured at different frequencies. Morphotropic phase transition (MPT) and the relaxation behavior which are new phenomenon for this system has been confirmed at room temperature.