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Analysis of Reliability for the Gate Level Fault Tolerant Design using Probabilistic Transfer Matrix method
Analysis of Reliability for the Gate Level Fault Tolerant Design using Probabilistic Transfer Matrix method
2017
Pradipkumar Dixit
Keywords:
Reliability engineering
Redundancy (engineering)
Transfer-matrix method (optics)
Fault tolerance
Probabilistic logic
Single event upset
Computer science
Correction
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