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X-ray refraction topography and computed tomography for NDE of lightweight materials (Keynote Paper)
X-ray refraction topography and computed tomography for NDE of lightweight materials (Keynote Paper)
2005
Bernd R. Mueller
Axel Lange
Michael Harwardt
Manfred P. Hentschel
Bernhard Illerhaus
Juergen Goebbels
Joachim Bamberg
Falko Heutling
Keywords:
X-ray
Materials science
Optics
Computed tomography
Refraction
Correction
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