Polarized O K edge spectra of Fe2O3 (0001) nanometric films: A full multiple scattering interpretation

Abstract An α-Fe 2 O 3 (0001) film epitaxially grown on an α-Al 2 O 3 (0001) substrate has been used for studying the polarization dependence of the XAS O–K edge. Experimentally, strong differences between the spectra recorded at θ =90° and θ =25° photon polarization orientations with respect to the surface are observed. Multiple scattering calculations allow one to explain the physical origin of each angle-dependent feature, in terms of single and multiple scattering events occurring in and out of the film surface plane.