Enhancement of magnetoresistance in La0.75Ca0.25MnO3 thin films grown on Si (100) substrates

Abstract The enhancement of magnetoresistance (MR) in La 0.75 Ca 0.25 M nO 3 thin films, grown on Si (1 0 0) substrates by RF magnetron sputtering, is studied. The films have single phase and show characteristics of a cubic perovskite structure. The out-of-plane lattice parameters of films are reduced as much as 0.9 % compared with the one of the bulk sample. It is found that the maximum MR (Δ ρ / ρ 0 ) of films are 0.34, 0.29 and 0.27 under the magnetic field of 1.5 T for each film with deposition temperatures of 700°C, 750°C and 800°C, respectively. The correlation between the magnetotransport property and lattice parameters of films is discussed. It seems that the enhancement of maximum MR can be attributed to the reduction of out-of-plane lattice parameters.