Nanometer scale conductance change in a Langmuir‐Blodgett film with the atomic force microscope

A nanometer scale metal/Langmuir‐Blodgett (LB) film/metal structure is realized with an atomic force microscope combined with scanning tunneling microscope (AFM/STM). Even in this nanometer scale configuration, increase in conductance can be induced at any point in the LB film by application of a voltage pulse. The AFM/STM observation shows little surface modification has occurred by the voltage application, which shows that the conductance of the LB film changes without pit formation in the LB film or metal cluster deposition from the tip of the probe.