Measurement and alignment of linear variable filters

Linear variable filters have become a common way to impart wavelength selectivity into optical systems with a minimum of optical elements. Measuring the filter in the presence of steep spectral-spatial gradients is the primary difficulty in characterizing these filters, requiring a small aperture beam resulting in a corresponding loss of signal power. We will discuss our approach to mapping the spectral and spatial distribution of these parts as well as a method to specify these filters. We will also suggest methods to calibrate and align the filters onto a detector, camera or chip.