Microstructure and microhardness of OFHC copper processed by high-pressure torsion

An ultra-high purity oxygen free high conductivity (OFHC) Cu was investigated to determine the evolution of microstructure and microhardness during processing by high-pressure torsion (HPT). Disks were processed at ambient temperature, the microstructures were observed at the center, mid-radius and near-edge positions and the Vickers microhardness was recorded along radial directions. At low strains, ?3 twin boundaries are formed due to dynamic recrystallization before microstructural refinement and ultimately a stabilized ultrafine grain structure is formed in the near-edge position with an average grain size of ~280 nm after 10 turns. Measurements show the microhardness initially increases to ~150 Hv at an equivalent strain of ~2, then falls to about ~80 Hv during dynamic recrystallization up to a strain of ~8 and thereafter increases again to a saturated value of ~150 Hv at strains above ~22. The delay in microstructure and microhardness homogeneity by dynamic recrystallization is attributed to the high purity of Cu that enhances dislocation mobility and causes dynamic softening during the early stages of straining.