Measurement Of Electron Irradiation Damage To Thinned Fairchild And Texas Instruments Charge-Coupled Devices (CCDs)

A Fairchild CCD211 (190X244 pixels) charge coupled device was thinned for photon and photoelectron rear-illumination experiments. Image smear due to injection of charge into the interline transfer registers was measured, and leakage current changes as a result of photoelectron irradiation were recorded. As expected, damage rates were less than 10 -4 of those measured for front side irradiation. Similar damage data were taken at UCSD on the Texas Instrument 100X160 thinned array. Nearly identical damage rates were measured for the two arrays.