Reliability investigations of 1.55 /spl mu/m bulk semiconductor optical amplifier using functional parameter measurements

We report results of ageing tests (270 mA, 100/spl deg/C) applied to 1.55 /spl mu/m Semiconductor Optical Amplifier (SOA) of 500 /spl mu/m length active region for reliability investigations and show the strong relationship between functional parameters and their drifts versus ageing time.