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Assessment of Erase-Verify Function in NAND Arrays with Charge-Based Capacitance Measurement
Assessment of Erase-Verify Function in NAND Arrays with Charge-Based Capacitance Measurement
2011
L. H. Chong
Y. W. Chang
K.F. Chen
Y. J Chen
S-H Ku
Nian-Kai Zous
I. J. Huang
T.T. Han
M.S. Chen
W-P Lu
K.-C. Chen
C. Y. Lu
Keywords:
Nanotechnology
NAND gate
Electronic engineering
Materials science
Capacitance
Optoelectronics
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