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Spectral Interferometric Microscopy for Fast and Broadband Phase Characterization
Spectral Interferometric Microscopy for Fast and Broadband Phase Characterization
2020
Lior Michaeli
Danielle Ben Haim
Mukesh Sharma
Haim Suchowski
Tal Ellenbogen
Keywords:
Optics
Optoelectronics
Chemistry
Broadband
Interferometric microscopy
Astronomical interferometer
Liquid crystal
Correction
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