Testing and Characterization of High Power Semiconductor Lasers

High power semiconductor laser is a compact and precision optoelectronic device manufactured by a series of complicated fabrication processes. The performances of a semiconductor laser, such as its output power, wavelength, and spectrum are important for applications. Testing of the common parameters of a semiconductor laser is a route process for users for incoming material quality control and manufacturing procedure. Furthermore, testing is a part of semiconductor laser manufacturing process as well. Besides testing, characterization of some uncommon but important features is very important in the development of high power semiconductor lasers and failure analysis. By characterization of these features, such as spatial spectrum, smile and transient thermal impedance, one can have a deep understanding of the behavior of the diode laser, investigate the physics behind the features, and find out a solution to improve the performance and property of the devices.