Electrical overstress protection for electronic devices

This book investigates electrical overstress (EOS) protection schemes for microelectronic devices. It evaluates benefits versus performance and cost penalties for submicron and VLSI devices, and also presents a review of physical mechanisms which cause EOS failure in semiconductor devices. Further, the book defines EOS sensitivity characterization procedures and considers EOS sensitivity of micron and submicron linewidth circuit structures. The book is presented in two parts. Part I covers submicron devices and Part II details VLSI devices. In both cases the investigations utilized the charged device (CD) model and the human body discharge (HBD) model.