VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating

A method is presented to measure materials and extract the complex permittivity without using classic VNA calibrations and time-gating. It is based on frequency selective normalization, analyzing error-terms and multiple-reflection phenomena. Measurement results (in free-space) are presented in 75-110 GHz and 500-750 GHz bands. The new normalization technique reduces uncertainties and simplifies the process.