Compendia of radiation test results of integrated circuits

Phil Layton,Charlie Gilbert,Ed Patnaude,Gale Williamson,Larry Longden,Clancy Sloan

Compendia of radiation test results of integrated circuits

2005

Phil Layton
Charlie Gilbert
Ed Patnaude
Gale Williamson
Larry Longden
Clancy Sloan

TID and SEE data was taken to qualify and evaluate IC devices for radiation susceptibility in the natural space environment. A summary of the test data is presented and discussed

Keywords:

Electrical engineering
Space environment
Test data
Dosimetry
Radiation effect
Engineering
Radiation
Electronic engineering
Integrated circuit
Absorbed dose
Single event upset
Space technology

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