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Consideration of Open Faults Model Based on Digital Measurement of TEG Chip
Consideration of Open Faults Model Based on Digital Measurement of TEG Chip
2010
Tsutsumi Toshiyuki
Kariya Yasuyuki
Yamazaki Koji
Hashizume Masaki
Yotsuyanagi Hiroyuki
Takahashi Hiroshi
Higami Yoshinobu
Takamatsu Yuzo
Keywords:
Fault model
Chip
Electronic engineering
Computer science
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