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Current Transport Mechanisms in Au-Free Metallizations for CMOS Compatible GaN HEMT Technology
Current Transport Mechanisms in Au-Free Metallizations for CMOS Compatible GaN HEMT Technology
2020
Fabrizio Roccaforte
Monia Spera
Salvatore Di Franco
Raffaella Lo Nigro
Patrick Fiorenza
Filippo Giannazzo
Ferdinando Iucolano
Giuseppe Greco
Keywords:
Optoelectronics
cmos compatible
Composite material
High-electron-mobility transistor
Materials science
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