Crystal structure of organosilicon compounds

An x-ray diffraction structural analysis was carried out on trimethyl(1-silatranylmethyl)ammonium iodide on a diffractometer using 1792 reflections to R = 0.069. The length of the transannular Si-N bond (2.08(1) A) corresponds to that calculated using the Taft substituent constant for CH2N (CH3)3. The nonbonded interactions lead to marked departure of the N-Si-C(H2) fragment from linearity (the angle at the Si atom is 175.7(6)) and expansion of the SiC(H2)N bond angle to 121.2(9). The nature of the ionic interaction in the crystal is discussed.