Attosecond-resolved petahertz carrier motion in semi-metallic TiS2

Knowledge about the real-time response of carriers to optical fields in solids is paramount to advance information processing towards optical frequencies or to understand the bottlenecks of light-matter interaction and energy harvesting. Of particular importance are semi-metals and transition metal dichalcogenides due to their small band gap and high carrier mobility. Here, we examine the opto-electronic response of TiS2 to optical excitation by means of attosecond soft x-ray spectroscopy at the L-edges of Ti at 460 eV. Using weak-field infrared single-photon excitation, we examine conditions that avoid excessive excitation, but still attain efficient injection of 0.2% of valence band carriers into the lowest lying conduction band. We demonstrate that the efficient injection and the high- carrier mobility of the conduction band permits leveraging the material to achieve petahertz-speed opto-electronic control of its carriers. Our results are an important step towards understanding the dynamics of carriers and their control under field conditions that are realistic for device implementation in semi-metallic layered materials, thus they may lead to ultrafast and optically controlled field-effect devices and sensors.