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Check of semiconductor thermal resistance elements by the method of noise thermometry
Check of semiconductor thermal resistance elements by the method of noise thermometry
1982
A. B. Kisilevskii
S. P. Plotnikova
N. A. Sokolov
A. I. Eismont
Keywords:
Nuclear magnetic resonance
Mathematics
Semiconductor
Thermal resistance
Optoelectronics
Optics
Correction
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