Modeling Temperature Dependence of fT in 4H-SiC Bipolar Transistors

This paper models the temperature dependence of fT in 4H-SiC bipolar devices. The proposed model describes variation of the constituent parameters of fT as a function of temperature. The model assumes complete ionization of dopants in 4H-SiC. However, this assumption hampers the model’s utilityat temperatures below 300◦C. The model was simulated attemperatures between 300◦C and 700◦C and a drop in fT wasobserved. However, measurements are required to prove thecorrectness of the model or lack thereof.