Spectral characterization of Yb–doped silica layers for high power laser applications
2011
Abstract Thick silica layers, doped with rare-earth elements are required as active media for high power waveguide lasers and amplifiers. In this work, Yb/Al-codoped silica particles were deposited on pure silica wafers, followed by high temperature sintering and post-sinter laser annealing treatment. The optical properties of the layers were monitored at different stages of the process using transmission spectrometry in the near IR to UV range, micro-Raman spectroscopy, fluorescence spectrum, and decay measurements. Evolution of the Yb 3+ ion fluorescence and stabilization of the Si:O bonds as a result of the sintering process were observed. Measurements of 30 μm thick layers showed high Yb absorption of 500 dB/m at 980 nm. The fluorescence lifetime was close to 1 ms and the propagation loss was less than 20 dB/m at 633 nm, currently limited by the measurement system. The results show that a potential material for high power applications has been achieved.
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