Factors Affecting the Operating Parameter of a Memristor Based on a LiF Thin Film with Cu Nanoclusters

Factors affecting the operating parameter of a memristor (Roff/Ron) are considered. The increase in this parameter as the current of a magnetron and the period of irradiation are increased while preparing a LiF thin film with copper nanoclusters is studied. The synaptic behavior of a memristor based on this film is demonstrated.