In situ x-ray diffraction study of the thermal expansion of the ordered arrays of silver nanowires embedded in anodic alumina membranes

Thermal expansion of as-prepared and annealed ordered arrays of silver nanowires embedded in anodic alumina membranes (AAMs) was studied by in situ x-ray diffraction measurement in the temperature range from 25to800°C. The axial thermal expansion coefficient (TEC) for the as-prepared nanowires is 6.35×10−9∕°C and 6.02×10−6∕°C below and above 650°C, respectively. However, the TEC of the annealed sample turns from 2.32×10−6∕°Cto12.06×10−6∕°C when the temperature is above 350°C. The collective effects of the intrinsic expansion, surface pressure, the limit effect of AAM, and the vacancies incorporated into the silver lattice were responsible for the thermal expansion.