Characteristic Investigation on Substructures of High Purity Al Rolled at Room Temperature

Micro-orientation data of a high purity Al rolled up to total thickness reduction of 80% at room temperature were determined using SEM-EBSD technique, conceptions of describing substructure information, such as subgrain misorientation (θcry), and average misorientation (θenv) of circumjacent subgrains for a special subgrain, etc., were suggested and corresponding GCDP-OI soft package was developed. It is found that the subgrains sizes increase rapidly from about 2 to 7 μm with increasing misorientations from 1° to 15°, and the total number frequency of which is more than 95%. However, taking into account local features of subgrais, whose sizes for Dcry/Denv > 1 are 2 times larger than that for Dcry/Denv 1, θcry/θenv > 1, vice versa.