An experimental investigation of complex devices for avionics using 14MeV neutron

In this paper, we explore the single event effect (SEE) characterization of multiple devices (DSP, SRAM, FPGA) for avionics using a 14MeV neutron source. Based on the experimental results and an analysis of applicability of 14MeV neutron beams, the SEE rate has been calculated. An experiment scheme on ground has been designed including SEE detection, experimental setup, testing procedure. The results of the single event upset were acquired and then the cross section was calculated. Finally, a SEE rate calculation method is proposed to translate testing results to terrestrial environments’ SEU rate.