Metrology and process control

Abstract TPP will surpass the perimeters of advanced research laboratories only when it will develop a comprehensive set of tests and analyses that can guarantee the repeatability and consistency required in a for-profit environment. In a sense, TPP can certainly learn from the axiom use in the Integrated Chip (IC) technology business that says “you can’t make it if you can’t measure it.” While it is true that TPP will never require the same level of perfection as the one developed for IC manufacturing, it can certainly learn from it the rigor required in designing and measuring all steps involved in the process so that a large fraction of the products meet the desired specifications. This can be summarized by stating that high yields require both metrology and process control.