Preliminary ellipsometric studies and tests for measuring the birefringence of electro-optic materials

Ellipsometry is a convenient means to ascertain electro-optic properties, and the null-type methods are particularly so because they do not require a powermeter. Electro-optic materials like Strontium Barium Niobate (SBN) with the symmetry axis normal or parallel to the surface are materials suitable for thin film integrated optic devices, therefore of practical interest. For this reason we endeavoured to devise and to test experimental arrangements that measure the birefringence of uniaxial structures with the symmetry axis parallel and perpendicular to the surface.