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TEM analysis of ZnO thin films grown on a -, c -, and r -plane sapphire substrates
TEM analysis of ZnO thin films grown on a -, c -, and r -plane sapphire substrates
2016
Saito Ochiai
Noriyuki Hasuike
Hiroshi Harima
Koji Nishio
Toshiyuki Isshiki
Keywords:
Thin film
Sapphire
Materials science
Mineralogy
Optoelectronics
oxide semiconductor
tem analysis
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