Variation of critical current and n-value of 2G HTS tapes in external magnetic fields of different orientation

The in-field orientation dependence of critical current and n-value in second generation high temperature superconductive tapes was investigated. The samples were manufactured by Metalorganic Chemical Vapour Deposition method with BaZrO3 inclusions (SuperPower Inc.) and Pulsed Laser Deposition method (Bruker HTS). For samples of each kind of fabrication techniques we observed higher critical current value in the case of external magnetic field aligned along (or nearby) c-axis direction in comparison with one aligned along ab-plane. We analysed possible reasons for this effect. Angular dependences of the critical current and n-value were investigated. The microstructure images of superconductive layer of studied samples show tilt of BaZrO3 nanorods in MOCVD sample and high density of structural defects for PLD sample.