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TECHNICAL NOTE: Effects of annealing conditions on photoelectrical properties of Ba1-xSrxNbyTi1-yO3 thin-film resistor
TECHNICAL NOTE: Effects of annealing conditions on photoelectrical properties of Ba1-xSrxNbyTi1-yO3 thin-film resistor
2006
B. Z. Li
H. B. Lo
P. T. Lai
Yunrui Liu
G Q Li
Min Huang
Keywords:
Thin film
Annealing (metallurgy)
Scanning electron microscope
Materials science
Dark current
Visible spectrum
Resistor
Optoelectronics
Optics
Grain boundary
Correction
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