Spatial pattern analysis of strawberry leaf blight in perennial production systems.

ABSTRACT Spatial pattern of the incidence of strawberry leaf blight, caused by Phomopsis obscurans, was quantified in commercial strawberry fields in Ohio using statistics for heterogeneity and spatial correlation. For each strawberry planting, two transects were randomly chosen and the proportion of leaflets (out of 15) and leaves (out of five) with leaf blight symptoms was determined from N = 49 to 106 (typically 75) evenly spaced sampling units, thus establishing a natural spatial hierarchy to compare patterns of disease. The beta-binomial distribution fitted the data better than the binomial in 92 and 26% of the 121 data sets over 2 years at the leaflet and leaf levels, respectively, based on a likelihood ratio test. Heterogeneity in individual data sets was measured with the index of dispersion (variance ratio), C(α) test, a standard normal-based test statistic, and estimated θ parameter of the beta-binomial. Using these indices, overdispersion was detected in approximately 94 and 36% of the data set...