Anisotropic imaging for high-efficiency crystalline orientation determination of two-dimensional materials

2019 
The remarkable in-plane anisotropy of anisotropic two-dimensional materials (ATDMs) such as black phosphorus (BP), ReS2, and ReSe2 provides a new degree of freedom for designing novel orientation-based optical and electronic devices, therefore, visualizing the anisotropy and determining the crystalline orientation (CO) of ATDMs is of fundamental importance. Here, by using a setup equipped with non-polarized beam splitting, a four-dimensional anisotropic imaging technique (AIT) based on the anisotropic optical response of ATDMs was put forward, by which the COs of many different ATDMs on a same substrate can be effeciently(< 30 s), easily and simultaneously discerned. These key features are rather essential for later studying the properties and performances of ATDMs and its assembled van del Waals heterostructures. What’s more, AIT can also be used for observing the morphology and optical anisotropy of low-dimensional materials (ATDMs, sliver nanowires, graphene and so on) with higher resolution and sensitivity than traditional optical microscopy. With the help of AIT, the flexible modulation of optical and photothermal anisotropy can be achieved by fabricating orientation-controlled BP/ReS2 heterojunctions. Therefore, the AIT would greatly facilitate the further development of novel electronic, photonics and optoelectronic devices based on ATDMs.
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