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Hot Carrier effects by Gate Induced Drain Leakage Current
Hot Carrier effects by Gate Induced Drain Leakage Current
2012
Kwang-Soo Kim
Chang-Hoon Han
Jun-Ki Lee
Dongsoo Kim
Hyong-Joon Kim
Hea-Beoum Lee
Byoungdeog Choi
Keywords:
Leakage (electronics)
Gate oxide
Electronic engineering
Materials science
Optoelectronics
Correction
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