Characterization of interfacial chemistries associated with polymer systems by spatially resolved surface analytical methodologies

Abstract Two examples of recent advances in spatially resolved surface analytical characterization of paint and adhesive chemistries are presented. The examples extend previous analytical capabilities by combining the molecular specificity and bonding information of static secondary ion mass spectroscopy (SIMS) and X-ray photoelectron spectroscopy (XPS) with the ability to resolve features of interest spatially. In one example, a cross-section of two paint layers, only one of which contained a photostabilizer additive, was characterized by time-of-flight (TOF)-SIMS operated in a microscope mode. Results indicate possible migration of this additive into the bulk of the adjacent paint layer. The second example presents an XPS mapping technique which was used to study the interfacial corrosion chemistry of an epoxy adhesive applied to galvanized steel. The sample was subjected to a corrosive environment while under static load. This technique afforded spatially resolved chemical information over the entire interfacial failure surfaces and allowed localized regions of corrosion activity to be imaged. Comparisons of results and techniques are made, along with discussions of the limitations of each technique.