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Numerical simulation of vertical tunnelling field-effect transistors charge-trapping memory with TCAD tools
Numerical simulation of vertical tunnelling field-effect transistors charge-trapping memory with TCAD tools
2021
Yang Cao
Guoliang Tian
Majumdar Sandip
Jinshun Bi
Kai Xi
Bo Li
Keywords:
memory window
Computer simulation
Trapping
Charge (physics)
Materials science
Optoelectronics
Quantum tunnelling
Field-effect transistor
Correction
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