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Toward spectral-domain optical coherence tomography on a silicon chip
Toward spectral-domain optical coherence tomography on a silicon chip
2013
B.I. Akça
Boris Povazay
Aneesh Alex
Kerstin Worhoff
R.M. de Ridder
Wolfgang Drexler
Markus Pollnau
Keywords:
Materials science
Optical coherence tomography
Optoelectronics
silicon chip
spectral domain
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