Methodology for delivering reliable CIGS based building integrated photovoltaic (BIPV) products

A key challenge currently limiting the wide spread acceptance of Cu(In,Ga)Se 2 (CIGS) thin-film photovoltaic technologies in building integrated photovoltaic (BIPV) systems is the demonstration of product reliability in accelerated testing to support rapid product improvement cycles and new product introduction. To augment multi-year & geographically diverse real world performance a priori, one must adopt a creative approach to ensure rapid product introduction of new, highly reliable solar PV systems. Here, we present a synopsis of Dow Solar's reliability philosophy that utilizes multi-stress testing, a combination of accelerated and real world conditions, to provide predictive life stress relationships for CIGS based BIPV system level product performance. In addition, the methodology we present here includes a proactive philosophy of identifying and isolating individual reliability failure mechanisms in PV technologies. This philosophy enables significantly shorter development cycles and the obtainment of meaningful product performance feedback. The approach, which is balanced between accelerated testing and field testing data, may be utilized to establish lifetime performance of any PV technology.