High-precision ionization chamber for relative intensity monitoring of synchrotron radiation

Abstract A single channel, high-precision ionization chamber has been built for monitoring the relative intensity of X-rays in the energy range above 5 keV. It can be used in experiments, such as EXAFS, where simultaneous high-precision monitoring of the relative intensity during the actual experiment is required. In this paper the construction of the chamber and its performance during test measurements with an X-ray tube are presented.