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Nanometer level sampling and control of a scanning electron microscope | NIST
Nanometer level sampling and control of a scanning electron microscope | NIST
2015
Bradley N. Damazo
Andras Vladar
Olivier M. Marie-Rose
John A. Kramar
Keywords:
Nanometre
Atomic de Broglie microscope
Scanning electron microscope
NIST
Analytical chemistry
Sampling (statistics)
Materials science
Optics
Correction
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