Optimal Design of Accelerated Life Tests for One-shot Devices

Accelerated life test of One-shot devices has been a complicated subject for analysis due to its high reliability and destructiveness in the test. Due to its characteristics in the test, the achievement of failure data is difficult for prediction and analysis for reliability. Bayesian optimal design can provide enough information regarding the reliability while optimization of test design can occur with smaller sample size and test duration compare to previous optimal design methods. While the budget is fixed, application of lifetime distribution such as exponential and Weibull distribution is applied and comparative study will be performed to observe the difference of optimality criterion as well as experimental design. Also, comparative study of optimal design between reliable parameter estimation and inaccurate estimation will be performed.