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Quality evaluation of S-HEMTs and PM-HEMTs by drain current transients and L.F. channel noise analysis
Quality evaluation of S-HEMTs and PM-HEMTs by drain current transients and L.F. channel noise analysis
1995
Nathalie Saysset
Cristell Maneux
Nathalie Labat
Andre Touboul
Yves Danto
Keywords:
Electronic engineering
Communication channel
Physics
Materials science
Optoelectronics
drain current
Correction
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