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Development of a dual band X-mode reflectometer for the density profile measurement at the ICRF antenna in W7-X
Development of a dual band X-mode reflectometer for the density profile measurement at the ICRF antenna in W7-X
2019
X Han
A. Krämer-Flecken
J. Ongena
Olaf Neubauer
B. Schweer
Y. Liang
D. A. Hartmann
P. Kallmeyer
Yevgen O. Kazakov
Keywords:
Optics
Multi-band device
Physics
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