Single-shot measurements of carrier-envelope phase using time-dependent polarization pulse

Summary form only given. The control of CEP-slip of mode-locked laser oscillators has been demonstrated recently. To use the amplified high-intensity pulses, however, measurement of the CEP on a single-shot basis is preferable. Here, we propose a method for the single-shot measurement of the CEP by observing the electron angular distribution generated by ionization by a time-dependent polarization (TDP) pulse. Some important points such as the broadening of the distribution, Gouy phase shift, phase difference between the two components, and the asymmetric pulse shape, are discussed. This method is robust against intensity fluctuation because the positions of the peaks depend only on the CEP and the relative heights of the peaks depend on the peak intensity.