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Characterization of hole traps in hydrogen-implanted n-GaN
Characterization of hole traps in hydrogen-implanted n-GaN
2019
Kazuya Tamura
Ken Iyoda
Yutaka Tokuda
Kenji Shiojima
Jyoji Ito
Takahide Yagi
Keywords:
Materials science
Optoelectronics
Hydrogen
characterization
Ion implantation
Correction
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