DIELECTRIC BEHAVIOR OF ANNEALED POLY(VINYLIDENE FLUORIDE)

This study deals with the effect of annealing temperature of Polyvinylidene Fluoride quenched from melt into ice-water on the dielectric behavior. Measurements were carried out in the temperature range 25°C to 130°C and in the frequency range 1 kHz to 10 MHz. It was found that the dielectric permittivity and dielectric strength decreases with increasing annealing temperature. This is a result of morphological changes including defects creation, recrystallization and additional crystallization at expense of the amorphous phases.