Ellipsometry and electronic microscopy of ashes swept of the Popocatepetl volcano; Elipsometria y microscopia electronica de barrido de las cenizas del volcan Popocatepetl

2001 
The ellipsometry and the scanning electronic microscopy is applied to the study of the optic properties of Popocatepetl volcano ash in connection with the form, ruggedness and elemental chemical composition of the microparticles, also to argue about the relation with atmospheric conditions. [Spanish] Se aplica la eliposometria y la microscopia electronica de barrido al estudio de las propiedades opticas de las cenizas de volcan Popocatepetl en relacion con la forma, rugosidad y composicion quimica elemental de las microparticulas, destacandose su vinculacion con las condiciones de visibilidad.
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