A comparison of RS/1 and SPAYN for the generation of worst-case SPICE level 3 MOSFET model parameters

This paper compares RS/1 RPL routines developed at the NMRC which use principal component analysis and VARIMAX techniques to extract SPICE level 3 MOSFET nominal and worst-case model parameters, and the Silvaco international product SPAYN (Statistical Parameter and Yield analysis), a statistical analysis software program specifically designed for the microelectronics industry. (4 pages)